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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Cornejo, I.A. Jadidian, B. Akdogan, E.K. Safari, A. |
| Copyright Year | 1998 |
| Description | Author affiliation: Dept. of Ceramics & Mater. Eng., Rutgers Univ., Piscataway, NJ, USA (Cornejo, I.A.) |
| Abstract | The processing-property relationship in the system xPbNi/sub 1/3/Nb/sub 2/3/O/sub 3/-(1-x)[yPbTiO/sub 3/-(1-y)PbZrO/sub 3/] (PNN-PT-PZ), with 0.4/spl les/x/spl les/0.6 and 0.6/spl les/y/spl les/0.8, were investigated. Samples were processed by three different routes: direct reaction of the oxide constituents, Columbite precursor process, and the PNN-perovskite mixing route. Calcination and sintering studies were carried out at different temperatures for 1-8 hours under controlled PbO atmospheres. Phase evolution was monitored by powder x-ray diffraction (XRD). Scanning electron microscopy (SEM) was used for microstructural characterization. Maxima in the dielectric and electromechanical properties were obtained for samples with x=0.5 and y=0.7 that were sintered at 1200/spl deg/C. At room temperature, the highest dielectric constant was 6400 with a dissipation factor of 2%. These samples exhibit strong electromechanical coupling, k/sub t/=58 and k/sub p/=77%. The piezoelectric charge coefficient (d/sub 33/) of an optimum composition was found to be 820 pC/N. |
| Starting Page | 337 |
| Ending Page | 340 |
| File Size | 397183 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780349598 |
| ISSN | 10994734 |
| DOI | 10.1109/ISAF.1998.786702 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1998-08-24 |
| Publisher Place | Switzerland |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Dielectrics Scanning electron microscopy Niobium Calcination Temperature control Atmosphere Monitoring Powders X-ray diffraction X-ray scattering |
| Content Type | Text |
| Resource Type | Article |
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