NDLI: An Analytical Evaluation of the Prospective <formula formulatype=inline><tex Notation=TeX>${rm I}^{2}{rm t}$</tex></formula> to Assess Short-Circuit Capabilities of Cables and Busways

Content Provider	IEEE Xplore Digital Library
Author	Tartaglia, M. Mitolo, M.
Copyright Year	1986
Abstract	At the occurrence of three-phase or single-phase faults, abnormal levels of thermal energy are developed during the time taken by protective devices to clear them. By conservatively assuming an adiabatic process, all of the thermal let-through energy I²t, also referred to as Joule Integral, is accumulated within the components involved in short circuits; therefore, the temperature of their conductive materials is elevated. The thermal energy is proportional to the square of the short-circuit current. Evaluating the prospective I²t is, therefore, crucial in order to assess the short-circuit capability of cables and busways to withstand the thermal stress without failing or triggering fires in neighboring materials. In this paper, in the general case of resistive-inductive circuits, methods to evaluate the Joule Integral and to perform the assessment will be provided. The differences for power frequencies of 50 and 60 Hz are also shown.
Sponsorship	IEEE Power Engineering Society
Starting Page	1334
Ending Page	1339
Page Count	6
File Size	1709073
File Format	PDF
ISSN	08858977
Volume Number	25
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-07-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Thermal stresses Circuit faults Protection Thermal conductivity Temperature Conducting materials Cables Fires Performance evaluation Frequency time constant Busways cables fault duration faults Joule Integral protective devices short circuit
Content Type	Text
Resource Type	Article
Subject	Energy Engineering and Power Technology Electrical and Electronic Engineering

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