NDLI: Year 2000 impact on automated testing

Content Provider	IEEE Xplore Digital Library
Author	Waken, W. Hitt, G.
Copyright Year	1986
Abstract	Both US military and industry rely on automatic testing to verify the quality of manufacture and repair. Many testers still rely on computers designed and manufactured in the early 1980's. This includes systems using embedded controllers. Year 2000 problems can surface in computer operating systems, compilers, test programs, and in embedded systems. Until the impact of the Y2K "bug" is addressed, the risk of test program failure is unknown in most legacy automatic test systems. Problems may include embedded controllers in proprietary designs, old operating systems, and unique test program code. This paper will address the potential problem areas in automatic testing, and suggest an approach for determining the best course of action. In order to evaluate the impact, a complete systems inventory must be done to identify all potential sources of problems. Little attention has been paid to the legacy automated test systems and the potential impact of the Y2K problem on such systems. Although newer systems are less likely to be affected, no one can be sure until a complete inventory and test has been accomplished.
Starting Page	5
Ending Page	8
Page Count	4
File Size	340680
File Format	PDF
ISSN	08858985
Volume Number	14
Issue Number	7
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1999-07-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Automatic testing System testing Military computing Computer aided manufacturing Automatic control Control systems Operating systems Defense industry Electrical equipment industry Manufacturing industries
Content Type	Text
Resource Type	Article
Subject	Aerospace Engineering Electrical and Electronic Engineering Space and Planetary Science

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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