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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Drenkow, G. |
| Copyright Year | 1986 |
| Abstract | An expanding number of test system architectural choices has caused confusion in the test engineering community. This will show the strengths and weaknesses of existing test system architectures including rack and stack systems with GPIB instruments and modular systems like VXI and PXI. It will provide a glimpse into an emerging new architecture: LAN-based test systems. The paper reviews key concerns such as costs, channel counts, footprints, IO speeds, ease-of-integration, and flexibility. The objective of the paper is to provide engineers insight into the most effective test systems for their future applications. |
| Starting Page | 27 |
| Ending Page | 32 |
| Page Count | 6 |
| File Size | 1155952 |
| File Format | |
| ISSN | 08858985 |
| Volume Number | 20 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2005-05-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | System testing Instruments Costs Operating systems Data acquisition Aerospace testing Computer architecture Design engineering Electrical equipment industry Manufacturing industries |
| Content Type | Text |
| Resource Type | Article |
| Subject | Aerospace Engineering Electrical and Electronic Engineering Space and Planetary Science |
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