NDLI: Thermal decay in high density disk media

Content Provider	IEEE Xplore Digital Library
Author	Yun Zhang Bertram, H.N.
Copyright Year	1965
Abstract	An experimental technique has been developed to accurately measure the time dependence of playback voltage due to the decay of recorded magnetization patterns. A "calibration" procedure is utilized to minimize the effect of magnetoresistive head sensitivity variations. This technique is applied to a systematic study of the dependence of the signal decay on recording bit density and magnetic layer thickness in longitudinal thin film media. A Neel-Arrhenius type model is introduced to calculate the degradation of a square wave magnetization pattern subject to thermal agitation. Because the equivalent external field which reduces the energy barrier is the time and spatially varying magnetostatic field produced by magnetic transitions, an iterative procedure is utilized to obtain the time dependent magnetization. The model takes into account distributions of grain volume and anisotropy axis. The calculation results are compared with the experimental data and good agreement is obtained.
Sponsorship	IEEE Magnetics Society
Starting Page	3786
Ending Page	3793
Page Count	8
File Size	251148
File Format	PDF
ISSN	00189464
Volume Number	34
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Magnetization Magnetic anisotropy Perpendicular magnetic anisotropy Magnetostatic waves Time measurement Voltage Magnetoresistance Magnetic heads Magnetic recording Magnetic films
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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