NDLI: Noise in thin-film inductive heads

Content Provider	IEEE Xplore Digital Library
Author	Klaassen, K.B. van Peppen, J.C.L.
Copyright Year	1965
Abstract	The sources of thermal noise in thin-film inductive recording heads are investigated. These noise sources are associated with the various losses in the heads. An equivalent circuit model of the head impedance whose parameters are fitted to the measured impedance over a 100-MHz frequency range has been made. The head is read out by a low-noise preamplifier whose input impedance and input-referred voltage and current noise are also measured. Of the ensuing channel front-end (head plus preamplifier), the total noise is determined as well as the relative contributions of the various head and electronics noise sources and their spectral distribution. For a typical (36 turns, 5.6 mu m trackwidth) head and a 20-MHz channel bandwidth, most of the noise was contributed by the DC-resistance of the copper coil (R/sub c/=21.6 Omega ). The voltage and current noise of the electronics came next. For higher data rate channels the current noise of the electronics and the eddy current damped magnetization rotation over the skin depth in the center region of the yoke were shown to be the important noise sources.<>
Sponsorship	IEEE Magnetics Society
Starting Page	2097
Ending Page	2099
Page Count	3
File Size	355585
File Format	PDF
ISSN	00189464
Volume Number	28
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1992-09-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Transistors Magnetic heads Circuit noise Thin film circuits Impedance measurement Preamplifiers Voltage Equivalent circuits Frequency measurement Current measurement
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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