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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Byun, C. Rauch, G.C. Ramaswamy, S. Greggi Jr., J. |
| Copyright Year | 1965 |
| Abstract | Lorentz TEM (transmission electron microscopy) images and associated electron diffraction patterns of magnetic domains recorded on thin-film media under various conditions are described. Various patterns of deflected diffraction spots are observed, depending on the state of magnetization of the specimen. Black and white contrast in Foucault images is controlled by the position of the aperture and results from both the magnetization distribution in the ferromagnetic thin-film specimen and the fringing fields above and below the specimen. Also shown is the effect of overwrite currents on the domain images.< |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 5190 |
| Ending Page | 5192 |
| Page Count | 3 |
| File Size | 325145 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 27 |
| Issue Number | 6 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1991-11-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Magnetic domains Diffraction Electron microscopy Magnetic force microscopy Apertures Lenses Magnetization Electron beams Control systems Lighting |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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