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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Oki, A.K. Kim, M.E. Gorman, G.M. Camou, J.B. |
| Copyright Year | 1963 |
| Abstract | Logarithmic IF amplifiers that implement both true and successive-detection designs are reported. Monolithically cascaded log gain stages are used to achieve piecewise-approximated logarithmic functions for the compression of signals over a wide dynamic range. The heterojunction bipolar transistor (HBT) IC fabrication process is based on a 3- mu m-emitter, self-aligned-base ohmic metal transistor using both molecular-beam epitaxy (MBE) and metal-organic metal vapor deposition (MOCVD) growth structures. The true log amp integrates four dual-gain (limiting and unity gain) stages without on-chip video detection. Its performance includes DC-3-GHz IF/video bandwidth, 400-ps rise time, <+or-dB log error over approximately=40-dB dynamic range at 3 GHz, and a tangential signal sensitivity (noise) of -60 dBm (test-set limited). The successive-detection log amp, designed for lower frequency and dynamic range applications, uses three limiting gain stages and four detector stages to achieve a 550-MHz bandwidth and <-0.34-dB log error over a 27-dB dynamic range. It is able to process 13-ns pulses with 5.0-ns and 5.2-ns risetimes and fall times, respectively.< |
| Sponsorship | IEEE Microwave Theory and Techniques Society |
| Starting Page | 1958 |
| Ending Page | 1965 |
| Page Count | 8 |
| File Size | 1004001 |
| File Format | |
| ISSN | 00189480 |
| Volume Number | 36 |
| Issue Number | 12 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1988-12-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Gallium arsenide Heterojunction bipolar transistors Dynamic range Molecular beam epitaxial growth Bandwidth Bipolar integrated circuits Fabrication Chemical vapor deposition MOCVD Testing |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electrical and Electronic Engineering Radiation |
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