NDLI: Imaging and analysis techniques for electrical trees using X-ray computed tomography

Content Provider	IEEE Xplore Digital Library
Author	Schurch, R. Rowland, S.M. Bradley, R.S. Withers, P.J.
Copyright Year	1994
Abstract	Electrical treeing is one of the main mechanisms of degradation in polymeric high voltage insulation, a precursor of power equipment failure. Electrical trees have been previously imaged mostly using two-dimensional imaging techniques; thereby loosing valuable information. Here we review the techniques that have been previously used and present the novel application of X-ray computed tomography (XCT) for electrical tree imaging. This non-destructive technique is able to reveal electrical trees, providing a threedimensional (3-D) view and therefore, a more complete representation of the phenomenon can be achieved. Moreover, taking virtual slices through the replica so created brings the possibility of internal exploration of the electrical tree, without the destruction of the specimen. Here, laboratory created electrical trees have been scanned using XCT with phase contrast enhancement, and 3-D virtual replicas created through which the trees are analyzed. Serial Block-Face scanning electron microscopy (SBFSEM) is shown to be a successful complementary technique. Computed tomography enables quantification of electrical tree characteristics that previously were not available. Characteristics such as the diameter and tortuosity of tree channels, as well as the overall tree volume can be calculated. Through the cross-section analysis, the progression of the number of tree channels and the area covered by them can be investigated. Using this approach it is expected that a better understanding of electrical treeing phenomenon will be developed.
Sponsorship	National Natural Science Foundation of China (NSFC) Region Centre Ville de Tours Conseil General D'Indre et Loire ABB IEEE Sandia National Laboratories TOSHIBA
Starting Page	53
Ending Page	63
Page Count	11
File Size	2672304
File Format	PDF
ISSN	10709878
Volume Number	21
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Image resolution X-ray imaging Materials Scanning electron microscopy Optical imaging SBFSEM Electrical trees Three-dimensional 3-D Imaging X-ray Tomography XCT SEM SS-SEM
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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