NDLI: Electrical treeing behavior of DC and thermally aged polyethylenes utilizing wire-plane electrode geometries

Content Provider	IEEE Xplore Digital Library
Author	Xiangrong Chen Mantsch, A.R. Libin Hu Gubanski, S.M. Blennow, J. Olsson, C.-O.
Copyright Year	1994
Abstract	This paper presents electrical treeing behavior in low density polyethylene (LDPE) and cross-linked polyethylene (XLPE) after exposure to thermal and DC electro-thermal ageing. Both the ageing and the treeing tests were performed by means of two different types of test objects with wire-plane electrode geometry. One type of the tested objects contained only wire electrode of 10 μm diameter, whereas in the other type the wire electrode was attached through a semiconducting tab. The ageing was performed at 80°C with and without 10 kV DC voltage of both polarities connected to the wire and lasted up to 800 hours. The AC electrical treeing tests were applied afterwards for detecting changes of material properties after the ageing. The results showed that the electrical tree inception voltage consistently decreased with increasing time of thermal exposure, whereas the applied DC electric stress had a negligible effect on the observed behavior. Similar effects were found in both the tested materials (LDPE and XLPE) though the object type also influenced the results. For the objects with semiconducting tab, a higher level of the scale parameter was registered because of shielding effect of the tab on the electric field strength at the wire electrode. It also yielded less number of trees growing in parallel at the electrode. The dominant effect of thermal stress on the ageing of LDPE was elucidated by using various analytical techniques, like differential scanning calorimetry, infrared spectroscopy, inductively coupled plasma optical emission spectrometry and oxidation induction time, and it is believed to mainly affect antioxidant content in the test objects.
Sponsorship	National Natural Science Foundation of China (NSFC) Region Centre Ville de Tours Conseil General D'Indre et Loire ABB IEEE Sandia National Laboratories TOSHIBA
Starting Page	45
Ending Page	52
Page Count	8
File Size	1250020
File Format	PDF
ISSN	10709878
Volume Number	21
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Aging Electrodes Wires Electric fields Polymers Vegetation Weibull statistics Electrical treeing ageing LDPE XLPE wire-plane electrodegeometries
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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