NDLI: Dynamic Performance Characterization of Embedded Single-Ended Mixed-Signal Circuits

Content Provider	IEEE Xplore Digital Library
Author	Byoungho Kim Abraham, J.A.
Copyright Year	2004
Abstract	The inherent fault-masking characteristic of the traditional loopback test produces overly pessimistic estimates of device-under-test (DUT) performance, which negatively impacts product yield, although the loopback test provides a promising low-cost test solution. The proposed method overcomes the fault-masking shortcomings of the loopback test for single-ended mixed-signal circuits by accurately characterizing the performance parameters of the individual DUTs, based on the imbalance generation technique of our previous work. Basically, the proposed method is the case study of the previous work to validate the expansibility to a single-ended circuit testing. A sinusoidal stimulus is applied to the DUT, and our loopback configuration converts the external single-ended loopback path to differential mode, in order to generate the phase imbalance between the differential pair. The imbalanced differential signals then switch back to a single-ended mode and stimulate the DUT, in order to introduce the DUT loopback responses of different weight. The nonlinear characteristic equations are then derived to characterize the individual DUT performances. Hardware measurements show that our cost-effective test approach can accurately predict DUT performance parameters.
Sponsorship	IEEE Circuits and Systems Society
Starting Page	329
Ending Page	333
Page Count	5
File Size	304171
File Format	PDF
ISSN	15497747
Volume Number	61
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Radio frequency Mathematical model Equations Testing Adders Harmonic analysis Circuit faults mixed-signal circuit testing Analog-to-digital converter (ADC) digital-to-analog converter (DAC) loopback test
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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