NDLI: Multifrequency Excitation and Support Vector Machine Regressor for ECT Defect Characterization

Content Provider	IEEE Xplore Digital Library
Author	Bernieri, A. Betta, G. Ferrigno, L. Laracca, M. Mastrostefano, S.
Copyright Year	1963
Abstract	Eddy current testing (ECT) has three main tasks: detection, location, and characterization of defects. The characterization task, which means the ability to find the geometrical characteristics of the defect, is still in the research domain, although in many industrial applications this task has to be carried out with good accuracy to allow reliable acceptance or rejection decision indispensable to save costs and even human lives. This paper proposes an ECT measurement method that allows the reliable estimation of the geometrical characteristics of thin defects (i.e., length, height, and depth) by using a combination of a multifrequency excitation and an optimized support vector machine for regression. The proposed solution is tested on real specimens with known cracks by using a suitable measurement setup comprising a giant magnetoresistance-based biaxial ECT probe.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	1272
Ending Page	1280
Page Count	9
File Size	2069394
File Format	PDF
ISSN	00189456
Volume Number	63
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Probes Coils Software Data mining Feature extraction Reliability Materials support vector machine Defect characterization giant magnetoresistance (GMR) sensor multifrequency eddy current testing (ECT) nondestructive testing (NDT) signal processing
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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