NDLI: Non-Uniform Coverage by <formula formulatype=inline> <tex Notation=TeX>$n$</tex></formula>-Detection Test Sets

Content Provider	IEEE Xplore Digital Library
Author	Pomeranz, I.
Copyright Year	1993
Abstract	The use of n-detection test sets increases the likelihood of defect detection. With a uniform value of for all the target faults, the expectation is that defects across the circuit will be covered uniformly. This paper demonstrates that this may not be the case by considering the four-way bridging faults detected by n-detection test sets for single stuck-at faults in benchmark circuits. Partitioning the bridging faults into subsets according to their dominated line, the results show that certain subsets have significantly lower bridging fault coverage than others. Thus, certain defect sites are significantly less covered than others. This paper also shows that it is possible to predict which subsets will have low bridging fault coverage based on the numbers of detections of single stuck-at faults under a conventional one-detection test set. This observation leads to a simplified n-detection test generation strategy. It also points to the possibility of using higher numbers of detections for certain single stuck-at faults, or targeting other fault models only at the sites that are expected to be less covered.
Sponsorship	IEEE Computer Society Association for Computing Machinery (ACM)/SIGDA IEEE Computer Society Technical Committee on Design Automation
Starting Page	2138
Ending Page	2142
Page Count	5
File Size	277843
File Format	PDF
ISSN	10638210
Volume Number	20
Issue Number	11
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-11-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Fault detection Integrated circuit modeling Fault diagnosis Computational modeling test generation Bridging faults full-scan circuits $n$-detection test sets stuck-at faults
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Software Hardware and Architecture

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