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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Rong Zhang Lo, J.C.C. Lee, S.W.R. |
| Copyright Year | 2001 |
| Abstract | Flip chip is one of the packaging techniques for high-performance components. There is a greater demand on integrating more functions in a smaller chip nowadays. This leads to the increase of I/O density. Organic substrate is the bottleneck of the high-density packaging. A silicon interposer with through-silicon vias (TSVs) is commonly used to provide a platform with a high wiring density to redistribute I/Os. After I/O redistribution, larger solder joints with a larger pitch can be used to connect the interposer to the organic substrate. In this paper, a TSV-based silicon interposer with a cavity and copper pillars for 3-D packaging is presented. The cavity hosts the flip-chip device. There are copper-filled TSVs in the cavity to provide the electrical interconnections to the backside of the interposer. Flip-chip solder bumps are electroplated on the copper pillars. Subsequent to the flip-chip assembly process, the device is seated in the cavity entirely. The backside of the flip chip is lower than that of the surface of the interposer. This provides a better environment for further die stacking on the surface of the interposer. The microfabrication process of the proposed silicon interposer with TSVs in cavities is discussed in detail. |
| Sponsorship | IEEE Electron Devices Society IEEE Reliability Society |
| Starting Page | 189 |
| Ending Page | 193 |
| Page Count | 5 |
| File Size | 473208 |
| File Format | |
| ISSN | 15304388 |
| Volume Number | 12 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Cavity resonators Copper Silicon Packaging Flip chip Three dimensional displays Etching 3-D packaging Cavities interposer through-silicon via (TSV) |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Safety, Risk, Reliability and Quality Electrical and Electronic Engineering |
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