NDLI: Shape Deformation in Two-Dimensional Electrical Impedance Tomography

Content Provider	IEEE Xplore Digital Library
Author	Boyle, A. Adler, A. Lionheart, W.R.B.
Copyright Year	1982
Abstract	Electrical impedance tomography (EIT) uses measurements from surface electrodes to reconstruct an image of the conductivity of the contained medium. However, changes in measurements result from both changes in internal conductivity and changes in the shape of the medium relative to the electrode positions. Failure to account for shape changes results in a conductivity image with significant artifacts. Previous work to address shape changes in EIT has shown that in some cases boundary shape and electrode location can be uniquely determined for isotropic conductivities; however, for geometrically conformal changes, this is not possible. This prior work has shown that the shape change problem can be partially addressed. In this paper, we explore the limits of compensation for boundary movement in EIT using three approaches. First, a theoretical model was developed to separate a deformation vector field into conformal and non-conformal components, from which the reconstruction limits may be determined. Next, finite element models were used to simulate EIT measurements from a domain whose boundary has been deformed. Finally, an experimental phantom was constructed from which boundary deformation measurements were acquired. Results, both in simulation and with experimental data, suggest that some electrode movement and boundary distortions can be reconstructed based on conductivity changes alone while reducing image artifacts in the process.
Sponsorship	IEEE Engineering in Medicine and Biology Society IEEE Nuclear and Plasma Sciences Society IEEE Signal Processing Society IEEE Ultrasonics, Ferroelectrics, and Frequency Control Society
Page Count	9
File Size	1579938
Starting Page	2185
Ending Page	2193
File Format	PDF
ISSN	02780062
Volume Number	31
Issue Number	12
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Conductivity Electrodes Shape Tomography Vectors Finite element methods Image reconstruction tomography Biomedical imaging conformal mapping finite element methods impedance measurement reconstruction algorithms shape measurement
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Computer Science Applications Radiological and Ultrasound Technology Software

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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