NDLI: Optimum Degradation Tests for Comparison of Products

Content Provider	IEEE Xplore Digital Library
Author	Guangbin Yang
Copyright Year	1963
Description	Life tests are often conducted to compare products, designs, or processes to select the one that has the highest reliability. To make a sound decision, engineers may require the tests to continue until all or most of the test units fail. As such, the test time is often excessive, especially when we test high-reliability products. For some products, a failure is said to have occurred when a performance characteristic reaches a specified threshold. For these products, reliability is defined by the performance characteristic. Then comparing the reliabilities of two products can be turned into comparison of their performance characteristics. During testing, it is possible to measure the performance characteristics at different times. Measurement data can be employed to predict whether or not the performance characteristics of the two products will be significantly different at the time of interest, e.g., design life, warranty time, or specified test time. When there are sufficient data to make such a prediction with a high degree of confidence, the test can be terminated. As a result, the test time is reduced. This paper presents a method for comparing the performance characteristics of two products with a reduced test time, where the log performance characteristics are -normally distributed with a mean as a (transformed) linear function of time, and a constant standard deviation. In particular, the paper describes a test method, test termination rules, and degradation modeling. Then we develop an overlap probability as a metric to measure the difference between two products. The confidence interval for the overlap probability is calculated. The reliability and its confidence interval are computed from the degradation data. The paper also delineates optimum test plans which choose sample size and test time to minimize the variance of an estimate related to the overlap probability, and simultaneously satisfy the constraints on test budget and available sample size. The test plans are robust against the pre-estimates of model parameters. The proposed method is illustrated with a practical example. The application shows that the method is effective at reducing test time.
Sponsorship	IEEE Reliability Society
Starting Page	220
Ending Page	226
Page Count	7
File Size	366341
File Format	PDF
ISSN	00189529
Volume Number	61
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Degradation Reliability Time measurement Size measurement Testing Maximum likelihood estimation Extraterrestrial measurements test time reduction Degradation test optimum test plan overlap probability sample size sensitivity analysis
Content Type	Text
Resource Type	Article
Subject	Safety, Risk, Reliability and Quality Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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