NDLI: An Interpolation-Based Calibration Architecture for Pipeline ADC With Nonlinear Error

Content Provider	IEEE Xplore Digital Library
Author	Jie Yuan Sheung Wai Fung Kai Yin Chan Ruoyu Xu
Copyright Year	1963
Abstract	The linearity of a pipeline analog-to-digital converter (ADC) is mainly limited by capacitor mismatch and finite operational amplifier (OPAMP) gain, which cause large power and design difficulty in modern nanometer CMOS processes for high-resolution pipeline ADCs. It is a trend of developing digital calibration techniques to compensate the analog error in pipeline stages. This paper systematically introduces a novel interpolation-based digital calibration architecture to compensate both linear and nonlinear errors from pipeline stages. The new method does not require convergence. The effect of calibration error is analyzed in detail in this paper. A prototype 20-MS/s pipeline ADC is fabricated in a 0.35-μm 3.3-V CMOS process. For 12-b resolution, the digital calibration improves the ADC differential nonlinearity and integral nonlinearity from 1.47 LSB and 7.85 LSB to 0.2 LSB and 0.27 LSB. For a 590-kHz sinusoidal signal, the calibration improves the ADC signal-to-noise-distortion ratio and spurious-free dynamic range from 41.3 dB and 52.1 dB to 72.5 dB and 84.4 dB, respectively. With the new calibration technique, low-gain OPAMPs and small capacitors are used in the pipeline. The designed ADC has 0.78-pJ/step figure of merit (FOM), which is among the lowest reported FOMs for high-resolution pipeline ADC designs. The new architecture requires an accurate calibration ADC (CalADC) and two digital decoders. CalADC is implemented on-chip with 6.5% die area and 8.9% power. The decoders are synthesized to have 912 gates and consume 23.4% ADC power.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	17
Ending Page	25
Page Count	9
File Size	988287
File Format	PDF
ISSN	00189456
Volume Number	61
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Pipelines Calibration Capacitors Circuit noise Decoding Gain Transfer functions pipeline ADC Digital calibration high-resolution pipeline analog-to-digital converter (ADC) linear error multiplying digital-to-analog converter (MDAC) nonlinear error
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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