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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Kai Wu Cheng Pan Yongpeng Meng Changhao Sun Minggang Gao Kai Qin Hongyu Long |
| Copyright Year | 1994 |
| Abstract | In order to quantitatively study partial discharge (PD) behavior in voids under square voltage, the feasibility of PD measurement by detection of light emission intensity was investigated at first. Experiments were carried out to study the influences of void size on the correlation between light emission intensity and PD magnitude and its transition with PD degradation. It is confirmed that a good correlation existed between light emission intensity and PD magnitude in a void with diameter larger than 3mm and the correlation did not change in the PD degradation process. Then, the effect of square voltage rise rate on PD characteristics under square voltage was investigated by detecting light emission intensity. In the PD degradation process, an abnormal phenomenon that the maximum PD magnitude decreased with the increase of voltage rise rate was observed. This was interpreted in terms of the change of surface condition due to PD degradation. |
| Sponsorship | National Natural Science Foundation of China (NSFC) Region Centre Ville de Tours Conseil General D'Indre et Loire ABB IEEE Sandia National Laboratories TOSHIBA |
| File Size | 1183454 |
| File Format | |
| ISSN | 10709878 |
| Volume Number | 18 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-10-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Partial discharges Voltage measurement Aging Discharges Correlation Degradation Partial discharge measurement degradation PD light intensity square voltage voltage rise rate |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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