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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Jun So Pak Joohee Kim Jonghyun Cho Kiyeong Kim Taigon Song Seungyoung Ahn Junho Lee Hyungdong Lee Kunwoo Park Joungho Kim |
| Copyright Year | 2011 |
| Abstract | The impedance of a power-distribution network (PDN) in three-dimensionally stacked chips with multiple through-silicon-via (TSV) connections (a 3D TSV IC) was modeled and analyzed using a power/ground (P/G) TSV array model based on separated P/G TSV and chip-PDN models at frequencies up to 20 GHz. The proposed modeling and analysis methods for the P/G TSV and chip-PDN are fundamental for estimating the PDN impedances of 3D TSV ICs because they are composed of several chip-PDNs and several thousands of P/G TSV connections. Using the proposed P/G TSV array model, we obtained very efficient analyses and estimations of 3D TSV IC PDNs, including the effects of TSV inductance and multiple-TSV inductance, depending on P/G TSV arrangement and the number of stacked chip-PDNs of a 3D TSV IC PDN. Inductances related to TSVs, combined with chip-PDN inductance and capacitance, created high upper peaks of PDN impedance, near 1 GHz. Additionally, the P/G TSV array produced various TSV array inductance effects on stacked chip-PDN impedance, according to their arrangement, and induced high PDN impedance, over 10 GHz. |
| Starting Page | 208 |
| Ending Page | 219 |
| Page Count | 12 |
| File Size | 1813274 |
| File Format | |
| ISSN | 21563950 |
| Volume Number | 1 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-02-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Through-silicon vias Impedance Metals Three dimensional displays Integrated circuit modeling Inductance 3D TSV integrated circuit (IC) Power distribution network (PDN) PDN impedance stacked chip-PDN through-silicon-via (TSV) TSV array inductance TSV inductance three-dimensional (3D) |
| Content Type | Text |
| Resource Type | Article |
| Subject | Industrial and Manufacturing Engineering Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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