NDLI: A 32 nm High-k Metal Gate SRAM With Adaptive Dynamic Stability Enhancement for Low-Voltage Operation

Content Provider	IEEE Xplore Digital Library
Author	Kolar, P. Karl, E. Bhattacharya, U. Hamzaoglu, F. Nho, H. Yong-Gee Ng Yih Wang Zhang, K.
Copyright Year	1966
Abstract	SRAM bitcell design margin continues to shrink due to random and systematic process variation in scaled technologies and conventional SRAM faces a challenge in realizing the power and density benefits of technology scaling. Smart and adaptive assist circuits can improve design margins while satisfying SRAM power and performance requirements in scaled technologies. This paper introduces an adaptive, dynamic SRAM word-line under-drive (ADWLUD) scheme that uses a bitcell-based sensor to dynamically optimize the strength of WLUD for each die. The ADWLUD sensor enables 130 mV reduction in SRAM Vccmin while increasing frequency yield by 9% over conventional SRAM without WLUD. The sensor area overhead is limited to 0.02% and power overhead is 2% for a 3.4 Mb SRAM array.
Sponsorship	IEEE Solid-State Circuits Society IEEE Electron Devices Society IEEE Circuits and Systems Society Japan Society of Applied Physics (JSAP) IEEE Microwave Theory and Techniques Society IEEE San Francisco Section Bay Area Council Univ. PA IEEE
Starting Page	76
Ending Page	84
Page Count	9
File Size	1878533
File Format	PDF
ISSN	00189200
Volume Number	46
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Random access memory Temperature sensors Temperature measurement Temperature distribution Silicon Transistors Circuit stability 32 nm CMOS memory integrated circuits high-k+metal-gate process variations read assist sram sensors static random-access memory (SRAM) systematic variation Vccmin word-line under-drive
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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