NDLI: Fast Digital Post-Processing Technique for Integral Nonlinearity Correction of Analog-to-Digital Converters: Validation on a 12-Bit Folding-and-Interpolating Analog-to-Digital Converter

Content Provider	IEEE Xplore Digital Library
Author	Kerzérho, V. Fresnaud, V. Dallet, D. Bernard, S. Bossuet, L.
Copyright Year	1963
Abstract	The semiconductor industry tends to constantly increase the performances of developed systems with an ever-shorter time-to-market. In this context, the conventional strategy for mixed-signal component design, which is based only on analog design effort, will no longer be suitable. In this paper, a digital correction technique is presented for analog-to-digital converters (ADCs). The idea is to use a lookup table (LUT) for the online correction of integral nonlinearity (INL). The main challenge for this kind of technique is the cost in time and resources to estimate the actual INL of the ADC needed to load the LUT. In this paper, we propose to extract INL with a very rapid procedure based on spectral analysis. We validate our technique on a 12-bit folding-and-interpolating ADC and we demonstrate that the correction is efficient for a large range of application fields.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	768
Ending Page	775
Page Count	8
File Size	950570
File Format	PDF
ISSN	00189456
Volume Number	60
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Analog-digital conversion Table lookup Time to market Costs Circuits Councils Noise level Electronics industry Spectral analysis System performance nonlinearity correction Analog-to-Digital Converter (ADC) Integral Non-Linearity (INL) lookup table (LUT)
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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Fast Digital Post-Processing Technique for Integral Nonlinearity Correction of Analog-to-Digital Converters: Validation on a 12-Bit Folding-and-Interpolating Analog-to-Digital Converter

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