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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Chen, G. Tham, C. |
| Copyright Year | 1994 |
| Abstract | Electrical treeing is one of the main reasons for long term degradation of polymeric materials used in high voltage AC applications. In this paper we report on an investigation of electrical tree growth characteristics in XLPE samples from a commercial XLPE power cable. Electrical trees have been grown over a frequency range from 20 Hz to 500 Hz and images of trees were taken using CCD camera without interrupting the application of voltage. The fractal dimension of electric tree is obtained using a simple box-counting technique. Contrary to our expectation it has been found that the fractal dimension prior to the breakdown shows no significant change when frequency of the applied voltage increases. Instead, the frequency accelerates tree growth rate and reduces the time to breakdown. A new approach for investigating the frequency effect on trees has been devised. In addition to looking into the fractal analysis of tree as a whole, regions of growth are being sectioned to reveal differences in terms of growth rate, accumulated damage and fractal dimension. |
| Sponsorship | National Natural Science Foundation of China (NSFC) Region Centre Ville de Tours Conseil General D'Indre et Loire ABB IEEE Sandia National Laboratories TOSHIBA |
| Starting Page | 179 |
| Ending Page | 188 |
| Page Count | 10 |
| File Size | 391076 |
| File Format | |
| ISSN | 10709878 |
| Volume Number | 16 |
| Issue Number | 1 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-02-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Trees - insulation Power cable insulation Frequency Fractals Breakdown voltage Thermal degradation Polymers Power cables Charge coupled devices Charge-coupled image sensors Electrical tree, fractal dimension, box-counting, variable frequency, growth rate, accumulated damage, partial discharge. |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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