NDLI: Analyzing the Inherent Reliability of Moderately Sized Magnetic and Electrostatic QCA Circuits Via Probabilistic Transfer Matrices

Content Provider	IEEE Xplore Digital Library
Author	Dysart, T.J. Kogge, P.M.
Copyright Year	1993
Abstract	As computing technology delves deeper into the nanoscale regime, reliability is becoming a significant concern, and in response, Teramac-like systems will be the model for many early non-CMOS nanosystems. Engineering systems of this type requires understanding the inherent reliability of both the functional cells and the interconnect used to build the system, and which components are most critical. One particular nanodevice, quantum-dot cellular automata (QCA), offers unique challenges in understanding the reliability of its basic circuits since the device used for logic is also used for interconnect. In this paper, we analyze the reliability properties of two classes of QCA devices: molecular electrostatic-based and magnetic-domain-based. We use an analytic model, probabilistic transfer matrices (PTMs), to compute the inherent reliability of various nontrivial circuits. Additionally, linear regression is used to determine which components are most critical and estimated the reliability gains that may be achieved by improving the reliability of just a critical component. The results show the critical importance of different structures, especially interconnect, as used by the two classes of QCA.
Sponsorship	IEEE Computer Society Association for Computing Machinery (ACM)/SIGDA IEEE Computer Society Technical Committee on Design Automation
Starting Page	507
Ending Page	516
Page Count	10
File Size	646894
File Format	PDF
ISSN	10638210
Volume Number	17
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-04-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Electrostatic analysis Magnetic analysis Quantum cellular automata Magnetic circuits Integrated circuit interconnections Computers Reliability engineering Systems engineering and theory Nanoscale devices Quantum dots quantum-dot cellular automata (QCA) Circuit reliability nanoelectronics probabilistic transfer matrices
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Software Hardware and Architecture

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Accurate reliability evaluation using quantum-dot cellular automata probabilistic transfer matrix

Reliability Impact of N-Modular Redundancy in QCA

Designing quantum-dot cellular automata circuits using a robust one layer crossover scheme

Modeling of Electrostatic QCA Wires

A novel universal (FNZ) gate in quantum dot cellular automata (QCA)

Efficient Design of a Hybrid Adder in Quantum-Dot Cellular Automata

Design of non-restoring binary array divider in quantum-dot cellular automata

Design of Quantum-dot Cellular Automata (QCA) based modular $2^{n}−1−2^{n}MUX-DEMUX$

Design Tools for an Emerging SoC Technology: Quantum-Dot Cellular Automata

Analyzing the Inherent Reliability of Moderately Sized Magnetic and Electrostatic QCA Circuits Via Probabilistic Transfer Matrices

Similar Documents

Accurate reliability evaluation using quantum-dot cellular automata probabilistic transfer matrix

Reliability Impact of N-Modular Redundancy in QCA

Designing quantum-dot cellular automata circuits using a robust one layer crossover scheme

Modeling of Electrostatic QCA Wires

A novel universal (FNZ) gate in quantum dot cellular automata (QCA)

Efficient Design of a Hybrid Adder in Quantum-Dot Cellular Automata

Design of non-restoring binary array divider in quantum-dot cellular automata

Design of Quantum-dot Cellular Automata (QCA) based modular $2^{n}−1−2^{n}MUX-DEMUX$

Design Tools for an Emerging SoC Technology: Quantum-Dot Cellular Automata

Analyzing the Inherent Reliability of Moderately Sized Magnetic and Electrostatic QCA Circuits Via Probabilistic Transfer Matrices