NDLI: Instruction-Based Online Periodic Self-Testing of Microprocessors with Floating-Point Units

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Instruction-Based Online Periodic Self-Testing of Microprocessors with Floating-Point Units

Content Provider	IEEE Xplore Digital Library
Author	Xenoulis, G. Gizopoulos, D. Psarakis, M. Paschalis, A.
Copyright Year	2004
Abstract	Online periodic testing of microprocessors is a valuable means to increase the reliability of a low-cost system, when neither hardware nor time redundant protection schemes can be applied. This is particularly valid for floating-point (FP) units, which are becoming more common in embedded systems and are usually protected from operational faults through costly hardware redundant approaches. In this paper, we present scalable instruction-based self-test program development for both single and double precision FP units considering different instruction sets (MIPS, PowerPC, and Alpha), different microprocessor architectures (32/64-bit architectures) and different memory configurations. Moreover, we introduce bit-level manipulation instruction sequences that are essential for the development of FP unit's self-test programs. We developed self-test programs for single and double precision FP units on 32-bit and 64-bit microprocessor architectures and evaluated them with respect to the requirements of low-cost online periodic self-testing: fault coverage, memory footprint, execution time, and power consumption, assuming different memory hierarchy configurations. Our comprehensive experimental evaluations reveal that the instruction set architecture plays a significant role in the development of self-test programs. Additionally, we suggest the most suitable self-test program development approach when memory footprint or low power consumption is of paramount importance.
Sponsorship	IEEE Computer Society
Starting Page	124
Ending Page	134
Page Count	11
File Size	3414081
File Format	PDF
ISSN	15455971
Volume Number	6
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-04-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Built-in self-test Microprocessors Circuit faults Fault detection System testing Hardware Protection Energy consumption Manufacturing Automatic testing microprocessor self-testing. Online periodic testing microprocessor self-testing on-line periodic testing
Content Type	Text
Resource Type	Article
Subject	Computer Science Electrical and Electronic Engineering

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