NDLI: An Improved Active Decoupling Capacitor for “Hot-Spot” Supply Noise Reduction in ASIC Designs

Content Provider	IEEE Xplore Digital Library
Author	Xiongfei Meng Saleh, R.
Copyright Year	1966
Abstract	On-chip decoupling capacitors (decaps) are widely used to reduce power supply noise by placing them at the appropriate locations on the chip between blocks. While passive decaps can provide a certain degree of protection against IR drop, if a problem is found after the physical design is completed, it is difficult to implement a quick fix to the problem. In this paper, we investigate the use of an active decap as a drop-in replacement for passive decaps to provide noise reduction for these so-called ldquohot-spotrdquo IR drop problems found late in the design process. A modified active decap design is proposed for ASIC applications operating up to 1 GHz. Our improvement uses latch-based comparators as the sensing circuit, which provides a better power/delay tradeoff than previous designs and incorporates hysteresis to minimize unnecessary switching. It is implemented in a 1 V-core 90 nm CMOS process with a total area of 0.085 mm² and static power of 2.8 mW. Measurements from a number of test chips show that using an active decap can provide between 10%-20% noise reduction in the 200 MHz-1 GHz frequency range over its passive counterpart. Sizing and placement analyses are also carried out using circuit simulation. The active decap is most effective when placed in close proximity to the hot-spot, as compared to the passive decap which is less sensitive to the exact location. Overall, if sized and placed properly, active decaps can provide an additional 20% reduction in supply noise over passive decaps.
Sponsorship	IEEE Solid-State Circuits Society IEEE Electron Devices Society IEEE Circuits and Systems Society Japan Society of Applied Physics (JSAP) IEEE Microwave Theory and Techniques Society IEEE San Francisco Section Bay Area Council Univ. PA IEEE
Starting Page	584
Ending Page	593
Page Count	10
File Size	903102
File Format	PDF
ISSN	00189200
Volume Number	44
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Capacitors Noise reduction Application specific integrated circuits Power supplies Protection Process design Delay Hysteresis Switching circuits CMOS process power supply noise MOS integrated circuits decoupling capacitors comparators
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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An Improved Active Decoupling Capacitor for “Hot-Spot” Supply Noise Reduction in ASIC Designs

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