NDLI: Application of a Failure Driven Test Profile in Random Testing

Content Provider	IEEE Xplore Digital Library
Author	Tsong Yueh Chen Fei-Ching Kuo Huai Liu
Copyright Year	1963
Abstract	Random testing techniques have been extensively used in reliability assessment, as well as in debug testing. When used to assess software reliability, random testing selects test cases based on an operational profile; while in the context of debug testing, random testing often uses a uniform distribution. However, generally neither an operational profile nor a uniform distribution is chosen from the perspective of maximizing the effectiveness of failure detection. Adaptive random testing has been proposed to enhance the failure detection capability of random testing by evenly spreading test cases over the whole input domain. In this paper, we propose a new test profile, which is different from both the uniform distribution, and operational profiles. The aim of the new test profile is to maximize the effectiveness of failure detection. We integrate this new test profile with some existing adaptive random testing algorithms, and develop a family of new random testing algorithms. These new algorithms not only distribute test cases more evenly, but also have better failure detection capabilities than the corresponding original adaptive random testing algorithms. As a consequence, they perform better than the pure random testing.
Sponsorship	IEEE Reliability Society
Starting Page	179
Ending Page	192
Page Count	14
File Size	572912
File Format	PDF
ISSN	00189529
Volume Number	58
Issue Number	1
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Software testing Software reliability Computer bugs Application software Subspace constraints Probability distribution Software debugging Performance evaluation Power capacitors Probability density function uniform distribution Adaptive random testing operational profile random testing test profile
Content Type	Text
Resource Type	Article
Subject	Safety, Risk, Reliability and Quality Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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