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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Cataldo, A. Monti, G. De Benedetto, E. Cannazza, G. Tarricone, L. Catarinucci, L. |
| Copyright Year | 1963 |
| Abstract | Antenna-characterization measurements are traditionally performed in the frequency domain (FD) through a vector network analyzer (VNA) in an anechoic chamber. Nevertheless, the high cost of the required setup strongly limits the possibility of using this approach. Starting from these considerations, a time-domain (TD)-based approach for characterizing antennas without using an anechoic chamber is assessed. As a matter of fact, instruments operating in TD are usually less expensive than VNAs; nevertheless, with appropriate data processing, they provide as much information. Particularly, it is demonstrated that the selection of an optimal time windowing is the main factor that guarantees a high accuracy level in the corresponding FD. The proposed approach leads to the accurate evaluation of the reflection scattering parameter S 11(f) from time-domain reflectometry (TDR) data. The experimental validation is tested on a commercial radio-frequency identification (RFID) reader antenna, and the results are compared with reference VNA measurements performed in an anechoic chamber. The ultimate goal of this paper is to demonstrate that, through calibrated TDR measurements, along with an optimal time windowing, an accurate antenna characterization can be achieved. |
| Sponsorship | IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc |
| Starting Page | 1412 |
| Ending Page | 1419 |
| Page Count | 8 |
| File Size | 905734 |
| File Format | |
| ISSN | 00189456 |
| Volume Number | 58 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-05-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Antenna measurements Anechoic chambers Performance evaluation Time domain analysis Radiofrequency identification Frequency measurement Frequency domain analysis Performance analysis Costs Instruments time-domain reflectometry (TDR) frequency-domain (FD) analysis microwave reflectometry scattering parameters |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Electrical and Electronic Engineering |
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