NDLI: Multimodal Solution for a Waveguide Radiating Into Multilayered Structures—Dielectric Property and Thickness Evaluation

Content Provider	IEEE Xplore Digital Library
Author	Ghasr, M.T. Simms, D. Zoughi, R.
Copyright Year	1963
Abstract	Open-ended rectangular waveguides are widely used for microwave and millimeter-wave nondestructive testing (NDT) applications, such as detecting disbond and delamination in multilayered composite structures, thickness evaluation of dielectric sheets and coatings on metal substrates, etc. When inspecting a complex multilayered composite structure that is made of generally lossy dielectric layers with arbitrary thicknesses and backing, the dielectric properties of a particular layer may be of particular interest (e.g., radome inspection). The same is also true when one is interested in the thickness, or, more importantly, thickness variation, of a particular layer within such complex structures. An essential tool for closely estimating the complex permittivity and/or thickness is an accurate forward electromagnetic model for simulating the reflection coefficient at the aperture of the probing open-ended waveguide. To this end, this paper provides a full-wave accurate forward model for calculating the reflection coefficient from a generally lossy multilayered composite structure possessing an arbitrary number of layers and respective thicknesses while accounting for the influence of higher order modes. This model is subsequently validated through comparisons with a commercial numerical tool and actual measurements. Furthermore, a measurement model is provided, which results in an iterative inverse technique for estimating the complex permittivity and thickness of a dielectric layer. Subsequently, this technique is applied to the measured reflection coefficients of several structures. To evaluate the accuracy of this technique, an analysis on its sensitivity to various sources of errors, and, most importantly, the effect of a finite flange size, is also demonstrated by using the simulated data. Finally, the potential of this model to accurately estimate the thickness of an individual layer, which represents a thin disbond, in a multilayered composite structure is presented.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	1505
Ending Page	1513
Page Count	9
File Size	430912
File Format	PDF
ISSN	00189456
Volume Number	58
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-05-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Electromagnetic waveguides Dielectric substrates Dielectric losses Dielectric measurements Permittivity measurement Electromagnetic reflection Rectangular waveguides Millimeter wave technology Nondestructive testing Delamination thickness Complex permittivity higher order modes open-ended waveguide stratified dielectric medium
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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