NDLI: Quantum Boolean Circuits are 1-Testable

Content Provider	IEEE Xplore Digital Library
Author	Yao-Hsin Chou I-Ming Tsai Sy-Yen Kuo
Copyright Year	2002
Abstract	Recently, a systematic procedure was proposed to derive a minimum input quantum circuit for any given classical logic with the generalized quantum Toffoli gate, which is universal in Boolean logic. Since quantum Boolean circuits are reversible, we can apply this property to build quantum iterative logic array (QILA). QILA can be easily tested in constant time (C-testable) if stuck-at fault model is assumed. In this paper, we use Hadamard and general controlled-controlled not gates to make QILA 1-testable. That is, for any quantum Boolean circuit, the number of test patterns is independent of both the size of the array and the length of the inputs.
Sponsorship	IEEE Nanotechnology Council
Starting Page	484
Ending Page	492
Page Count	9
File Size	466238
File Format	PDF
ISSN	1536125X
Volume Number	7
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-07-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Logic arrays Logic circuits Circuit faults Quantum computing Boolean functions Design for testability Nanostructures Logic design Logic testing reversible circuit C-testable design for testability (DFT) iterative logic array (ILA) M-testable quantum circuit quantum computation Iterative logic array (ILA)
Content Type	Text
Resource Type	Article
Subject	Nanoscience and Nanotechnology Electrical and Electronic Engineering Computer Science Applications

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