NDLI: Study on Contamination Control for Yield Enhancement in the Manufacturing Line of Cellular Phone Modules

Content Provider	IEEE Xplore Digital Library
Author	Kwang-Chul Noh Hyeon-Cheol Lee Dae-Young Kim Myung-Do Oh
Copyright Year	1999
Abstract	Practical studies on the method of contamination control for yield enhancement in the cellular phone modules production line were carried out. A contamination control method was proposed, consisting of data collection, data analysis, improvement action, verification, and implementation of control. The partition check method and the composition analysis for data collection and data analysis were respectively used in the cellular phone modules manufacturing process, and these methods were evaluated by the variation of yield loss before and after implementing the actions for improvement. In the partition check method, the critical process step was selected, and yield loss reduction through improvement actions was observed, whereas in the composition analysis, critical sources were selected, and yield loss reduction through improvement actions was investigated. From the results, it is concluded that the partition check and the composition analysis are effective solutions for contamination control in cleanroom production lines.
Sponsorship	IEEE Components, Packaging, and Manufacturing Technology Society International Microelectronics Assembly and Packaging Society (IMAPS)
Starting Page	143
Ending Page	149
Page Count	7
File Size	684652
File Format	PDF
ISSN	1521334X
Volume Number	31
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-04-01
Publisher Place	U.S.A.
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Contamination Cellular phones Production Data analysis Control systems Performance analysis Raw materials Inspection Manufacturing processes Mechanical engineering yield enhancement Cellular phone cleanroom contamination control defect
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Electrical and Electronic Engineering

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