NDLI: A 15-bit Linear 20-MS/s Pipelined ADC Digitally Calibrated With Signal-Dependent Dithering

Content Provider	IEEE Xplore Digital Library
Author	Yun-Shiang Shu Bang-Sup Song
Copyright Year	1966
Abstract	Pseudo-random dithers have been used to measure capacitor mismatch and opamp gain errors of the pipelined analog-to-digital converter (ADC) in background and to calibrate them digitally. However, this error measurement suffers from signal range reduction and long signal decorrelation time. A signal-dependent dithering scheme allows the injection of a large dither without sacrificing the signal range and shortens the signal decorrelation time. A 1.5-bit multiplying digital-to-analog converter (MDAC) stage is modified for signal-dependent dithering with two additional comparators, and its capacitor mismatch and gain errors are measured and calibrated as one error. When sampled at 20 MS/s, a 15-bit prototype ADC achieves a spurious-free dynamic range of 98 dB with 14.5-MHz input and a peak signal-to-noise plus distortion ratio of 73 dB with 1-MHz input. Integral nonlinearity is improved from 25 to 1.3 least significant bits (LSBs) after calibrating the first six stages. The chip is fabricated in 0.18-mu CMOS process, occupies an active area of 2.3 x 1.7 mm² , and consumes 285 mW at 1.8 V.
Sponsorship	IEEE Solid-State Circuits Society IEEE Electron Devices Society IEEE Circuits and Systems Society Japan Society of Applied Physics (JSAP) IEEE Microwave Theory and Techniques Society IEEE San Francisco Section Bay Area Council Univ. PA IEEE
Starting Page	342
Ending Page	350
Page Count	9
File Size	734790
File Format	PDF
ISSN	00189200
Volume Number	43
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Gain measurement Capacitors Decorrelation Analog-digital conversion Time measurement Digital-analog conversion Distortion measurement Prototypes Dynamic range CMOS process signal-dependent dithering Background calibration capacitor mismatch and gain calibration digital calibration pipelined analog-to-digital converter
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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