NDLI: Millimeter-Wave Phaseless Antenna Characterization

Content Provider	IEEE Xplore Digital Library
Author	Capozzoli, A. Curcio, C. D'Elia, G. Liseno, A.
Copyright Year	1963
Abstract	Phaseless antenna characterization at millimeter-wave frequencies is an awkward task for a number of reasons. First, suitable network analyzers appropriately working at a high frequency, as well as a complex hardware ensuring high positioning and alignment accuracies, are required. Furthermore, the characterization algorithm should be reliable and accurate and should require a reasonable measurement time, which is a key issue in the millimeter and submillimeter ranges. In this paper, we present an efficient algorithm that faces this problem by exploiting the available a priori information on the shape and size of the antenna. The reliability, accuracy, and stability of the approach reside on ldquoeffectiverdquo expansions of the unknown aperture field distribution, reducing the ldquoeffectiverdquo number of unknowns. ldquoFastrdquo acquisitions are enabled by nonuniformly distributed near-field measurements. Rectangular and circular apertures are dealt with by introducing prolate spheroidal wave functions and a Jacobi-Bessel series representation of the aperture field, respectively. The performances of the approach and its effectiveness in the millimeter frequency range are proven by the experimental results at 40, 94, and 100 GHz, made at the Antenna Laboratory of the University of Napoli Federico II, on horn antennas and a Cassegrain reflector.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	1330
Ending Page	1337
Page Count	8
File Size	444919
File Format	PDF
ISSN	00189456
Volume Number	57
Issue Number	7
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-07-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Frequency Apertures Antenna measurements Horn antennas Reflector antennas Millimeter wave measurements Hardware Time measurement Shape Stability phase retrieval millimeter-wave antennas near-field characterization phaseless near-field/far-field transformations
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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