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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Agarwal, P. Saraswat, G. Kumar, M.J. |
| Copyright Year | 1963 |
| Abstract | In this paper, by solving the 1-D Poisson equation using appropriate boundary conditions, we report a closed-form surface potential solution for all the three surfaces (gate oxide-silicon film interface, silicon-film-buried oxide interface, and buried oxide-substrate interface) of fully depleted silicon-on-insulator (SOI) MOSFETs by considering the effect of substrate charge explicitly. During the model derivation, it is assumed that the silicon film is always fully depleted and the back silicon film surface is never inverted. The calculated values of the surface potentials obtained from the proposed model agree well with the iterative solution of exact Poisson equation with a maximum relative error bound of 0.3%. In the entire model, only two square roots, one exponential, and two logarithm terms are used and the continuity and differentiability of the resultant surface potential solutions are ensured making the proposed model computationally efficient. |
| Sponsorship | IEEE Electron Devices Society |
| Starting Page | 789 |
| Ending Page | 795 |
| Page Count | 7 |
| File Size | 271435 |
| File Format | |
| ISSN | 00189383 |
| Volume Number | 55 |
| Issue Number | 3 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-03-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Silicon MOSFET circuits Electric potential Substrates Films Integrated circuit modeling Mathematical model threshold voltage Compact modeling fully depleted silicon-on-insulator (SOI) MOSFET numerical solution surface potential |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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