NDLI: Online Fault Tolerance for FPGA Logic Blocks

Content Provider	IEEE Xplore Digital Library
Author	Emmert, J.M. Stroud, C.E. Abramovici, M.
Copyright Year	1993
Abstract	Most adaptive computing systems use reconfigurable hardware in the form of field programmable gate arrays (FPGAs). For these systems to be fielded in harsh environments where high reliability and availability are a must, the applications running on the FPGAs must tolerate hardware faults that may occur during the lifetime of the system. In this paper, we present new fault-tolerant techniques for FPGA logic blocks, developed as part of the roving self-test areas (STARs) approach to online testing, diagnosis, and reconfiguration . Our techniques can handle large numbers of faults (we show tolerance of over 100 logic faults via actual implementation on an FPGA consisting of a 20 times 20 array of logic blocks). A key novel feature is the reuse of defective logic blocks to increase the number of effective spares and extend the mission life. To increase fault tolerance, we not only use nonfaulty parts of defective or partially faulty logic blocks, but we also use faulty parts of defective logic blocks in nonfaulty modes. By using and reusing faulty resources, our multilevel approach extends the number of tolerable faults beyond the number of currently available spare logic resources. Unlike many column, row, or tile-based methods, our multilevel approach can tolerate not only faults that are evenly distributed over the logic area, but also clusters of faults in the same local area. Furthermore, system operation is not interrupted for fault diagnosis or for computing fault-bypassing configurations. Our fault tolerance techniques have been implemented using ORCA 2C series FPGAs which feature incremental dynamic runtime reconfiguration
Sponsorship	IEEE Computer Society Association for Computing Machinery (ACM)/SIGDA IEEE Computer Society Technical Committee on Design Automation
Starting Page	216
Ending Page	226
Page Count	11
File Size	987292
File Format	PDF
ISSN	10638210
Volume Number	15
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-02-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault tolerance Field programmable gate arrays Reconfigurable logic Logic arrays Hardware Logic testing Fault diagnosis Adaptive systems Adaptive arrays Programmable logic arrays reliability Adaptive computing fault tolerance field-programmable gate arrays (FPGA) reconfigurable computing reconfigurable systems
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Software Hardware and Architecture

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
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7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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