NDLI: Dual-Sampling Skewed CMOS Design for Soft-Error Tolerance

Content Provider	IEEE Xplore Digital Library
Author	Ming Zhang Shanbhag, N.R.
Copyright Year	2004
Abstract	Presented is a circuit technique that mitigates the impact of single-event transient (SET) in deep submicrometer circuits with minimal speed, power, and area penalty. The technique combines a novel dual-sampling flip-flop (DSFF) and the skewed CMOS (SCMOS) circuit style. The DSFF and SCMOS are designed to eliminate SETs with the polarity of 1rarr0 and 0rarr1, respectively. We study inverter chain circuits as well as sum-of-products implementation of random logic circuits in a typical 0.18-mum process under the influence of radiation induced soft errors. We quantify the SET tolerance of the proposed technique by using an error map and a recently developed tool soft-error rate analyzer (SERA). The results show that the DSFF incurs no speed penalty, if no SETs have reached the input of DSFF. Otherwise, the DSFF alone eliminates the 1rarr0 SETs while incurring a worst case speed and power penalty of 310 ps and 39 muW, respectively. The SCMOS eliminates the 0rarr1 SETs when the skewing factor is greater than four. Thus, the proposed technique potentially eliminates the impact of SETs with both polarities
Sponsorship	IEEE Circuits and Systems Society
Starting Page	1461
Ending Page	1465
Page Count	5
File Size	367203
File Format	PDF
ISSN	15497747
Volume Number	53
Issue Number	12
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Single event upset Flip-flops Latches Protection Combinational circuits Logic circuits Redundancy Inverters Integrated circuit reliability Power system reliability soft-error rate (SER) Combinational logic circuit flip-flop integrated- circuit reliability latch single-event transient (SET)
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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