NDLI: Improving Automatic Detection of Defects in Castings by Applying Wavelet Technique

Content Provider	IEEE Xplore Digital Library
Author	Xiaoli Li Tso, S.K. Xin-Ping Guan Qian Huang
Copyright Year	1982
Abstract	X-ray-based inspection systems are a well-accepted technique for identification and evaluation of internal defects in castings, such as cracks, porosities, and foreign inclusions. In this paper, some images showing typical internal defects in the castings derived from an X-ray inspection system are processed by some traditional methods and wavelet technique in order to facilitate automatic detection of these internal defects. An X-ray inspection system used to detect the internal defects of castings and the typical internal casting defects is first addressed. Second, the second-order derivative and morphology operations, the row-by-row adaptive thresholding, and the two-dimensional (2-D) wavelet transform methods are described as potentially useful processing techniques. The first method can effectively detect air-holes and foreign-inclusion defects, and the second one can be suitable for detecting shrinkage cavities. Wavelet techniques, however, can effectively detect the three typical defects with a selected wavelet base and multiresolution levels. Results indicate that 2-D wavelet transform is a powerful method to analyze images derived from X-ray inspection for automatically detecting typical internal defects in the casting
Sponsorship	IEEE Industrial Electronics Society
Starting Page	1927
Ending Page	1934
Page Count	8
File Size	326666
File Format	PDF
ISSN	02780046
Volume Number	53
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-12-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Casting X-ray imaging Inspection X-ray detection X-ray detectors Wavelet transforms Morphology Two dimensional displays Wavelet analysis Image analysis X-ray inspection Castings defects image processing wavelet transform
Content Type	Text
Resource Type	Article
Subject	Control and Systems Engineering Electrical and Electronic Engineering Computer Science Applications

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