NDLI: A stability criterion for high-accuracy /spl Delta/-/spl Sigma/ digital resonators

Content Provider	IEEE Xplore Digital Library
Author	Macii, D. Pianegiani, F. Carbone, P. Petri, D.
Copyright Year	1963
Abstract	While microelectronic companies are increasingly focused on the production of system on chips (SoCs) comprising both analog and digital sections, the expenses related to the test of high-density mixed-signal chips have become the main cost factor due to the long testing time and the need for complex automated test equipment (ATE). Built-in self-test (BIST) techniques represent an effective solution to tackle this problem, as they rely on the integration of testing-oriented resources on the same chip to be tested. Among all the possible circuits to be used for BIST purposes, simple and high-purity harmonic resonators are essential to perform an accurate characterization of analog-to-digital converters (ADCs). In particular, /spl Delta/-/spl Sigma/ harmonic resonators are very suitable for BIST schemes, but they have proved to be critically stable and difficult to implement due to the lack of clear design criteria. In this paper, a general method to analyze the behavior of /spl Delta/-/spl Sigma/ harmonic resonators is presented. The proposed criterion suggests some guidelines to implement more stable and robust resonators.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	577
Ending Page	583
Page Count	7
File Size	241030
File Format	PDF
ISSN	00189456
Volume Number	55
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-04-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Stability criteria Automatic testing Built-in self-test Circuit testing System testing Microelectronics Production systems System-on-a-chip Costs Test equipment Built-in self-test (BIST) harmonic resonator root locus stability analysis
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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