NDLI: HV impulse measuring systems analysis and qualification by estimation of measurement errors via FFT, convolution, and IFFT

Content Provider	IEEE Xplore Digital Library
Author	Matyas, Z. Aro, M.
Copyright Year	1963
Abstract	Quality of high-voltage (HV) impulse measurements requires adequate dynamic performance of measuring systems (MS) with respect to the waveforms to be measured. Qualification of MSs for various impulses is a prerequisite for repeatability and reproducibility of HV testing results. Alternative qualification procedures are considered with respect to the standard full lightning impulse including evaluation of significance of its frequency components. Duality of step responses and amplitude-frequency responses is described in detailed examples. Special attention is paid to creeping, encountered with some converting devices. Variations of MS response parameters can lead to improper conclusions when only conventional examination of the dynamic behavior is used. Evaluation of the response parameters is an unnecessary step, which brings additional errors to the HV measurements. The paper is pointing out advantages and practical achievements of the frequency-domain qualification of dynamic properties based on the step response data obtained both experimentally and analytically. Measurement errors of the impulse peak value and time parameters have been evaluated via fast Fourier transform (FFT), convolution, and inverse discrete Fourier transform (IFFT) for a commercial divider. Direct determination of the HV impulse measurement range, no need for any additional parameters, and illustrative graphical presentation of results are the main advantages of this approach. Limitations of different qualification approaches are discussed.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	2013
Ending Page	2019
Page Count	7
File Size	290246
File Format	PDF
ISSN	00189456
Volume Number	54
Issue Number	5
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-10-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Qualifications Estimation error Measurement errors Convolution Pulse measurements Reproducibility of results Impulse testing Lightning Frequency domain analysis Fast Fourier transforms inverse discrete Fourier transform (IFFT) discrete Fourier transform (DFT) fast Fourier transform (FFT) frequency-domain analysis high-voltage (HV) measurement quality
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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