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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Datta, A. In-Yong Eom Dhar, A. Kuban, P. Manor, R. Ahmad, I. Gangopadhyay, S. Dallas, T. Holtz, M. Temkin, H. Dasgupta, P.K. |
| Copyright Year | 2001 |
| Abstract | The fabrication and testing of Teflon AF-coated channels on silicon and bonding of the same to a similarly coated glass wafer are described. With water or aqueous solutions in such channels, the channels exhibit much better light conduction ability than similar uncoated channels. Although the loss is greater than extruded Teflon AF tubes, light throughput is far superior to channels described in the literature consisting of [110] planes in silicon with 45/spl deg/ sidewalls. Absorbance noise levels under actual flow conditions using an LED source, an inexpensive photodiode and a simple operational amplifier circuitry was 1/spl times/ 10/sup -4/ absorbance units over a 10-mm path length (channel 0.17-mm deep /spl times/0.49-mm wide), comparable to many commercially available macroscale flow-through absorbance detectors. Adherence to Beer's law was tested over a 50-fold concentration range of an injected dye, with the linear r/sup 2/ relating the concentration to the observed absorbance being 0.9993. Fluorescence detection was tested with fluorescein as the test solute, a high brightness blue LED as the excitation source and an inexpensive miniature PMT. The concentration detection limit was 3 /spl times/ 10/sup -9/ M and the corresponding mass detection limit was estimated to be 5 /spl times/ 10 /sup -16/ mol. |
| Sponsorship | IEEE Sensors Council |
| Starting Page | 788 |
| Ending Page | 795 |
| Page Count | 8 |
| File Size | 471374 |
| File Format | |
| ISSN | 1530437X |
| Volume Number | 3 |
| Issue Number | 6 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-12-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Liquid waveguides Silicon Testing Light emitting diodes Fabrication Wafer bonding Glass Throughput Noise level Photodiodes |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation Electrical and Electronic Engineering |
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