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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Cooper, B.F.C. |
| Copyright Year | 1931 |
| Abstract | A bridge is described which measures the small-signal parameters of point contact and junction transistors at a frequency of 1 kc. The impedance parameters of point-contact transistors are measured for the grounded-base connection, while a set of parameters representing a compromise between the impedance parameters and the h parameters is measured for junction transistors operating in either the grounded-base or grounded-emitter connections. This set includes the short-circuit input impedance h11, the short circuit current amplification factor h2l, a paralleled resistance r22 and capacitance C22 representing the open-circuit output impedance, and two feedback resistances r12 and r12' which in the particular case of the grounded-base connection represent the "low-frequency" base resistance rb and the "high-frequency" base resistance rb' respectively. It is also shown that the ¿ cut-off frequency of junction transistors can be calculated with good accuracy from the bridge measurements. |
| Starting Page | 796 |
| Ending Page | 805 |
| Page Count | 10 |
| File Size | 2987489 |
| File Format | |
| ISSN | 00968390 |
| Volume Number | 43 |
| Issue Number | 7 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1955-07-01 |
| Access Restriction | Subscribed |
| Rights Holder | The Institute of Radio Engineers, Inc. (IRE) |
| Subject Keyword | Bridge circuits Frequency measurement Impedance measurement Electrical resistance measurement Semiconductor device measurement Transistors Circuit testing Cutoff frequency Electronic equipment testing Admittance |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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