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  1. AT&T Technical Journal
  2. Year : 1994 Volume : 73
  3. Issue 2
  4. Boundary-scan testing for electronic subassemblies and systems
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Year : 1996 Volume : 75
Year : 1995 Volume : 74
Year : 1994 Volume : 73
Issue 6
Issue 5
Issue 4
Issue 3
Issue 2
AT&T innovation briefs
Testing goes critical path
Trends in digital device test methodologies
Automatic test generation for digital electronic circuits
Built-in self-test for digital integrated circuits
Boundary-scan testing for electronic subassemblies and systems
Extending design-for-test into the analog and mixed-signal domains
Ensuring structural testability of high-density SMT circuit packs
Non-destructive optical techniques for characterizing semiconductor materials and devices
Environmental stress testing
Issue 1
Year : 1993 Volume : 72
Year : 1992 Volume : 71
Year : 1991 Volume : 70
Year : 1990 Volume : 69
Year : 1989 Volume : 68
Year : 1988 Volume : 67
Year : 1987 Volume : 66
Year : 1986 Volume : 65
Year : 1985 Volume : 64

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Boundary-scan testing for electronic subassemblies and systems

Content Provider IEEE Xplore Digital Library
Author Yau, Chi W. Beausang, James Crane, F. Edward Jarwala, Najmi T. Tulloss, Rodham E.
Copyright Year 1985
Abstract Since 1990, an important change in electronic design and test methodologies has been under way. The change is facilitated by ANSI/IEEE 1149.1, which is known as the Test-Access Port and Boundary-Scan Architecture standard. AT&T Bell Laboratories played a major role in the promulgation of this standard, and AT&T design and manufacturing engineers have been implementing its provisions for several years. This paper reports on the ways in which the standard has been employed in developing AT&T products, the benefits that have been achieved, and the future opportunities available using the technology it details.
Starting Page 40
Ending Page 48
Page Count 9
File Size 5140357
File Format PDF
ISSN 87562324
Volume Number 73
Issue Number 2
Language English
Publisher American Telephone and Telegraph Company (AT&T)
Publisher Date 1994-01-01
Access Restriction Subscribed
Rights Holder Bell Labs
Content Type Text
Resource Type Article
Subject Engineering
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