NDLI: Built-in self-test for digital integrated circuits

Content Provider	IEEE Xplore Digital Library
Author	Agrawal, Vishwani D. Lin, Chih-Jen Rutkowski, Paul W. Wu, Shianling Zorian, Yervant
Copyright Year	1985
Abstract	The increasing complexity of digital integrated circuits (ICs) and the requirements of system quality and availability demand a new discipline in IC testing, known as built-in self-test (BIST). This paper introduces the basic approaches of this self-contained, reusable testing technique. It also presents different attributes of BIST schemes, their tradeoffs and available tools, and demonstrates a practical application of the schemes described.
Starting Page	30
Ending Page	39
Page Count	10
File Size	4863893
File Format	PDF
ISSN	87562324
Volume Number	73
Issue Number	2
Language	English
Publisher	American Telephone and Telegraph Company (AT&T)
Publisher Date	1994-01-01
Access Restriction	Subscribed
Rights Holder	Bell Labs
Content Type	Text
Resource Type	Article
Subject	Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Built-in self-test for digital integrated circuits