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Content Provider | IEEE Xplore Digital Library |
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Author | Ramaswamy, S. Tang, T. |
Copyright Year | 1963 |
Abstract | This paper proposes a scheme to compare different transport models which are used to simulate submicron semiconductor devices. The procedure requires self-consistent Monte Carlo simulation data for a particular test device. We have compared four different hydrodynamic transport models which have been proposed recently. All four sets of hydrodynamic equations can be cast into a single form by selecting appropriate models for various transport parameters. The advantage is that we can use the same discretized set of equations to implement different transport models. We have also compared the results obtained from the Monte Carlo consistency test with those obtained by the hydrodynamic equation solver. The consistency test has been used to highlight the merits and demerits of the transport models on a common platform.< |
Sponsorship | IEEE Electron Devices Society |
Starting Page | 76 |
Ending Page | 83 |
Page Count | 8 |
File Size | 631745 |
File Format | |
ISSN | 00189383 |
Volume Number | 41 |
Issue Number | 1 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1994-01-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Monte Carlo methods Semiconductor device testing Hydrodynamics Poisson equations Automatic testing Differential equations Silicon High definition video Conductors Senior members |
Content Type | Text |
Resource Type | Article |
Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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