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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Manhart, H. Rieder, W. |
| Copyright Year | 1978 |
| Abstract | Contact erosion depends on both duration and efficiency of interaction between arc and contacts. Arc motion in a magnetic field was recorded and the material loss caused by arc erosion was determined by weighing. The material loss related to 1 ms of arc interaction-named erodibility-was evaluated for the contact materials Ag/CdO and Ag/SnO/sub 2/. All tests were performed in one type of commercial contactor (rated current 110 A). The erodibility was determined for new and for partly eroded contacts prestressed during life tests under AC 3 and AC 4 conditions according to IEC Test Specification 158-1, AC 4 erosion was caused by break arcs mainly, the effect of make arcs being negligible, whereas AC 3 erosion was due to both break and make arcs; the latter was more effective in Ag/SnO/sub 2/ contacts. After AC 3 life tests the erodibility values determining the erosion of Ag/SnO/sub 2/ contacts at the site of arc formation were higher than those of Ag/CdO; after AC 4 life tests, however, there was hardly any difference between the erodibilities of the two materials.< |
| Sponsorship | IEEE Electronic Industries Alliance American Society of Mechanical Engineering (ASME) NBS SAE |
| Starting Page | 56 |
| Ending Page | 64 |
| Page Count | 9 |
| File Size | 824156 |
| File Format | |
| ISSN | 01486411 |
| Volume Number | 13 |
| Issue Number | 1 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1990-03-01 |
| Publisher Place | U.S.A. |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Life testing Magnetic materials Materials testing Contacts Manufacturing Magnetic fields Performance evaluation Contactors IEC standards Stress |
| Content Type | Text |
| Resource Type | Article |
| Subject | Industrial and Manufacturing Engineering Electronic, Optical and Magnetic Materials Engineering Electrical and Electronic Engineering |
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