NDLI: Magnetically Coupled Noise Induced by a Power Current in Josephson Computer Chip-to-Card Connections

Content Provider	IEEE Xplore Digital Library
Author	Tazoh, Y. Aoki, K. Yoshikiyo, H.
Copyright Year	1978
Abstract	Theoretical and experimental studies on magnetically coupled noise in Josephson computer chip-to-card connections are described. This noise is induced by a large-amplitude high-frequency power current. An analysis of chip surface magnetic field distributions generated by connector power current is presented. In this analytical model the contributions of the return current on ground planes and the shielding current on loops between the ground connectors to the magnetic field are considered. In order to confirm the validity of this model, the field distribution in a typical layout connection system is measured by using superconducting quantum interference device detectors fabricated on the chip. The measurement results are in good agreement with the calculated values. In addition, a typical connector layout, which reduces the magnetically coupled noise, is also designed. This shows that the region where a typical Josephson circuit receives over ten-percent\phinoise (here\phi0 is the magnetic flux quantum) is limited to less than about 300µm from the power connector.
Sponsorship	IEEE Electronic Industries Alliance American Society of Mechanical Engineering (ASME) NBS SAE
Starting Page	237
Ending Page	241
Page Count	5
File Size	674831
File Format	PDF
ISSN	01486411
Volume Number	9
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1986-09-01
Publisher Place	U.S.A.
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Couplings Magnetic noise Superconducting device noise Magnetic flux Connectors Superconducting magnets Magnetic shielding Magnetic field measurement Semiconductor device measurement Circuit noise
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Electronic, Optical and Magnetic Materials Engineering Electrical and Electronic Engineering

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