NDLI: Low-power temperature detector and rate of temperature change detector

Content Provider	IEEE Xplore Digital Library
Author	Aleksic, Zeljko J. Vasiljevic, Dragan M.
Copyright Year	1963
Abstract	A temperature detection switch and a “rate of temperature change” detection switch are designed by using the dependence of the inverse saturation current of the p-n junction on temperature. This current is compared to the constant reference current in the case of the temperature detector or, for the detector of the rate of temperature change, to the inverse saturation current of another p-n junction, having different thermal time constant and different junction area. Relying upon the shape of the static characteristic of the constant reference current source, realized in a usual manner, and the inversely polarized p-n junction, the low-power current comparator is realized by a simple series connection of the current sources, with the supply voltage applied at the end points and the detector output voltage derived from the midpoint. Besides describing the operating principle, the paper contains the analysis of the thermal model of the switches and the accuracy investigations. The design criteria are experimentally confirmed. Due to their accuracy (0.1°C), simplicity, and extremely low power consumption (supply current is less than 10 μA), present detectors are especially suitable for applications in fire alarms.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	571
Ending Page	575
Page Count	5
File Size	1805351
File Format	PDF
ISSN	00189456
Volume Number	IM-35
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1986-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Detectors Temperature measurement Temperature sensors Temperature dependence P-n junctions Temperature distribution
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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