NDLI: 1.25-MHz attenuation measurement system

Content Provider	IEEE Xplore Digital Library
Author	Ginley, Ronald A. Allred, C. McKay
Copyright Year	1963
Abstract	A system has been developed to make highly accurate measurements of nominally 6-dB increments of attenuation at 1.25 MHz. Initial experiments indicate a typical systematic error of 5 μB (1 μB = 0.00001 dB) with a resolution of 1 μB. A special linearity measurement system (LMS) using NBS-constructed linear tuned hybrids and power detectors has been used to determine the nonlinearity of a tuned 1.25-MHz power detector. This detector utilizes a single thermistor bead design with thermal isolation to obtain nearly linear tracking of a 4:1 change in input power. The nonlinear correction for this change, determined by the LMS, is on the order of 13 μB for the detector presently in use. This calibrated detector and another of similar design are used in the attenuation measurement system (AMS) to make power ratio measurements to determine the change in attenuation of the device under test (DUT). It is anticipated that changes of approximately 6 dB can be measured with initial insertion loss of up to 100 dB with an accuracy of 0.001 dB. A special design consideration will be required for units used for calibration in order to keep mismatch errors from significantly degrading the accuracies estimated above.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	463
Ending Page	466
Page Count	4
File Size	748823
File Format	PDF
ISSN	00189456
Volume Number	IM-35
Issue Number	4
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1986-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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