NDLI: Lamp: Automatic test generation for asynchronous digital circuits

Content Provider	IEEE Xplore Digital Library
Author	Chappell, S. G.
Copyright Year	1922
Description	An automatic test generation system has been developed to detect faults in combinational and sequential circuits. The circuit model treats logic circuits as interconnections of unit- and zero-time-delay gates. A series of time-dependent Boolean equations are derived from the logic network (starting from the network inputs) in terms of sequences of signals (input vectors) on the circuit input leads. These equations account for the effect of specific circuit faults. Many tests, each consisting of a sequence of input signals (input vectors), are needed to detect all single faults in a circuit. Tests are generated from the time-dependent equations using two different strategies: (i) a maximum-cover approach to detect a large number of faults quickly by generating tests for the faults on the circuit-input leads. The fault-detection level achieved by the maximum-cover tests is then evaluated using fault simulation; (ii) tests for individual faults not detected by the maximum-cover approach. ATG has been implemented on the IBM 360, Model 67, and IBM 370, Model 168, computers.
Starting Page	1477
Ending Page	1503
Page Count	27
File Size	2470918
File Format	PDF
ISSN	00058580
Volume Number	53
Issue Number	8
Language	English
Publisher	American Telephone and Telegraph Company (AT&T)
Publisher Date	1974-01-01
Access Restriction	Subscribed
Rights Holder	Bell Labs
Content Type	Text
Resource Type	Article
Subject	Engineering

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Lamp: Automatic test generation for asynchronous digital circuits