NDLI: Measurement of Bunch-Length by a Mode-Locked Laser with a Time Resolution of 10 Picoseconds

Content Provider	IEEE Xplore Digital Library
Author	Fischer, R. Rossmanith, R.
Copyright Year	1963
Abstract	In accelerators working at accelerating frequencies of several 100 MHz the bunch length is in the order of several hundred picoseconds. For obtaining good measurements the time resolution of the measuring apparatus should be 10 ps. With convenient electronic components such a high time resolution cannot be obtained. In this paper a method is described for measuring the bunch length optically by measuring the time structure of the light emitted by relativistic particles (synchrotron or Cerenkov radiation). The heart of the system is a wideband Nd3+-Glass Laser emitting infrared light at 1.06 ¿m. With a special technique, the so-called mode-locking, the laser is forced to emit high-intensity optical pulses of several GW peak power and a pulse-length of about 5 ps. These pulses enter a cell filled with a Kerr medium, e.g. CS2, and induce birefringence. Since the relaxation time of CS2 is small, the bire-fringent zone travels with c/n through the Kerr medium. Combinated with two polarizers the system works like a camera with a slit-shutter traveling at the velocity of light. By photographing a total time resolution of 10 ps is obtained.
Sponsorship	IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD
Starting Page	549
Ending Page	551
Page Count	3
File Size	2087892
File Format	PDF
ISSN	00189499
Volume Number	20
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1973-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Time measurement Laser mode locking Free electron lasers Optical pulses Length measurement Particle measurements Acceleration Frequency Electronic components Stimulated emission
Content Type	Text
Resource Type	Article
Subject	Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering

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