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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Butler, W.H. Mewes, T. Mewes, C.K.A. Visscher, P.B. Rippard, W.H. Russek, S.E. Heindl, R. |
| Copyright Year | 1965 |
| Abstract | We model “soft” error rates for writing (WSER) and for reading (RSER) for spin-torque memory devices that have a free layer with easy axis perpendicular to the film plane by solving the Fokker-Planck equation for the probability distribution of the angle that the free layer magnetization makes with the normal to the plane of the film. We obtain: 1) an exact, closed form, analytical expression for the zero-temperature switching time as a function of initial angle; 2) an approximate analytical expression for the distribution function of the direction of the magnetization and the exponential decay of the WSER as a function of the time the current is applied; 3) comparison of the approximate analytical expressions for the distribution function and WSER to numerical solutions of the Fokker-Planck equation; 4) an approximate analytical expression for the distribution function and WSER for the case in which the pinned layer is not collinear with the perpendicular free layer; 5) an approximate analytical expression for the linear increase in RSER with current applied for reading; 6) comparison of the approximate analytical formula for the RSER to the numerical solution of the Fokker-Planck equation; and 7) confirmation of the accuracy of the Fokker-Planck solutions by comparison with results of direct simulation using the single-macrospin Landau-Lifshitz-Gilbert equations with a random fluctuating field in the short-time regime for which the latter is practical. We find that the WSER decays at long times as exp[-2(i-1)τ] where the reduced time τ is related to the switching time, Gilbert damping and precession frequency through τ = αω0t, and the reduced current i is the ratio of the applied current to the critical current density for switching i=I̅/I0 . This exponentially decaying tail in WSER is not easily reduced by tilting the pinned layer magnetization. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 4684 |
| Ending Page | 4700 |
| Page Count | 17 |
| File Size | 1297887 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 48 |
| Issue Number | 12 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2012-12-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Switches Mathematical model Magnetization Equations Approximation methods Films Magnetic tunneling switching distribution Error rate Fokker-Planck magnetic memory spin torque |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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